Record Details

Finite difference time domain modeling of subwavelength-structured anti-reflective coatings

ScholarsArchive at Oregon State University

Field Value
Title Finite difference time domain modeling of subwavelength-structured anti-reflective coatings
Names Han, Katherine (creator)
Han, Hai-Yue (creator)
Stack, James, Jr. (creator)
Chang, Chih-Hung (creator)
Date Issued 2014-01 (iso8601)
Note This is an author's peer-reviewed final manuscript, as accepted by the publisher. The published article is copyrighted by The Applied Computational Electromagnetics Society and can be found at: http://www.aces-society.org/journal.php.
Abstract The finite difference time domain
(FDTD) method was used to model anti-reflective
properties of a variety of sub-wavelength
structures for 300 to 1300 nm input light. Light
hitting non-tapered nanostructures exhibited
interference patterns similar to thin film anti-reflective
coatings (ARCs), increasing the anti-reflective
effect at several wavelengths. The
lowest reflectance was observed with conical and
pyramidal nano-structures with bases of 100 or
200 nm and heights of 400 or 800 nm.
Genre Article
Topic Anti-reflective
Identifier Han, K., Han, H. Y., Stack Jr, J., & Chang, C. H. (2014). Finite Difference Time Domain Modeling of Sub-Wavelength Structured Anti-Reflective Coatings. Applied Computational Electromagnetics Society Journal, 29(1), 1-8.

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