Record Details

The effect of etches on surface recombination in silicon

ScholarsArchive at Oregon State University

Field Value
Title The effect of etches on surface recombination in silicon
Names Cheng, Dan Sang (creator)
Looney, James C. (advisor)
Date Issued 1962-11-15 (iso8601)
Note Graduation date: 1963
Abstract This thesis presents a limited investigation of the effects
of various etches on the surface properties of silicon. Surface
recombination velocities of silicon under different etching treatments
are compared by using the photoelectromagnetic effect. A
measure of the minority carriers lifetime by the photoconductive
decay method provides another means of comparing various surface
treatments and ambient atmospheres.
CP-4 etch yields the smallest surface recombination velocity
in silicon; while sodium dichromate solution has the pronounced
effect of reducing the minority carrier lifetimes in silicon. Ambient
atmospheres have no obvious influence on the surface recombination
velocity of silicon.
Genre Thesis/Dissertation
Topic Silicon
Identifier http://hdl.handle.net/1957/49071

© Western Waters Digital Library - GWLA member projects - Designed by the J. Willard Marriott Library - Hosted by Oregon State University Libraries and Press